CA1300281C - Substrate potential detecting circuit - Google Patents
Substrate potential detecting circuitInfo
- Publication number
- CA1300281C CA1300281C CA000584287A CA584287A CA1300281C CA 1300281 C CA1300281 C CA 1300281C CA 000584287 A CA000584287 A CA 000584287A CA 584287 A CA584287 A CA 584287A CA 1300281 C CA1300281 C CA 1300281C
- Authority
- CA
- Canada
- Prior art keywords
- node
- substrate
- detecting circuit
- semiconductor
- conductivity type
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 239000000758 substrate Substances 0.000 title claims abstract description 72
- 239000004065 semiconductor Substances 0.000 claims description 42
- 230000003334 potential effect Effects 0.000 claims description 4
- 230000004044 response Effects 0.000 claims description 4
- 229910052729 chemical element Inorganic materials 0.000 claims 2
- 238000009792 diffusion process Methods 0.000 abstract description 11
- 238000000034 method Methods 0.000 description 16
- 238000012546 transfer Methods 0.000 description 9
- 230000008569 process Effects 0.000 description 8
- 238000010586 diagram Methods 0.000 description 6
- 238000013461 design Methods 0.000 description 4
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 3
- 229910052782 aluminium Inorganic materials 0.000 description 3
- 230000008859 change Effects 0.000 description 3
- 230000000694 effects Effects 0.000 description 3
- 230000004048 modification Effects 0.000 description 3
- 238000012986 modification Methods 0.000 description 3
- 238000012545 processing Methods 0.000 description 3
- 230000000295 complement effect Effects 0.000 description 2
- 238000001514 detection method Methods 0.000 description 2
- 239000012535 impurity Substances 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 1
- 229920000136 polysorbate Polymers 0.000 description 1
- 238000002360 preparation method Methods 0.000 description 1
- 238000007493 shaping process Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
- H10D84/80—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D12/00 or H10D30/00, e.g. integration of IGFETs
- H10D84/82—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D12/00 or H10D30/00, e.g. integration of IGFETs of only field-effect components
- H10D84/83—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D12/00 or H10D30/00, e.g. integration of IGFETs of only field-effect components of only insulated-gate FETs [IGFET]
- H10D84/85—Complementary IGFETs, e.g. CMOS
- H10D84/859—Complementary IGFETs, e.g. CMOS comprising both N-type and P-type wells, e.g. twin-tub
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/27—Testing of devices without physical removal from the circuit of which they form part, e.g. compensating for effects surrounding elements
- G01R31/275—Testing of devices without physical removal from the circuit of which they form part, e.g. compensating for effects surrounding elements for testing individual semiconductor components within integrated circuits
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/145—Indicating the presence of current or voltage
- G01R19/155—Indicating the presence of voltage
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
- H10D84/01—Manufacture or treatment
- H10D84/0123—Integrating together multiple components covered by H10D12/00 or H10D30/00, e.g. integrating multiple IGBTs
- H10D84/0126—Integrating together multiple components covered by H10D12/00 or H10D30/00, e.g. integrating multiple IGBTs the components including insulated gates, e.g. IGFETs
- H10D84/0165—Integrating together multiple components covered by H10D12/00 or H10D30/00, e.g. integrating multiple IGBTs the components including insulated gates, e.g. IGFETs the components including complementary IGFETs, e.g. CMOS devices
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
- H10D84/60—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D10/00 or H10D18/00, e.g. integration of BJTs
- H10D84/67—Complementary BJTs
- H10D84/673—Vertical complementary BJTs
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Semiconductor Integrated Circuits (AREA)
- Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
- Design And Manufacture Of Integrated Circuits (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP62-302603 | 1987-11-30 | ||
| JP62302603A JPH01144667A (ja) | 1987-11-30 | 1987-11-30 | 基板電位検出回路 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CA1300281C true CA1300281C (en) | 1992-05-05 |
Family
ID=17910968
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CA000584287A Expired - Lifetime CA1300281C (en) | 1987-11-30 | 1988-11-28 | Substrate potential detecting circuit |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US4980745A (en]) |
| EP (1) | EP0318869B1 (en]) |
| JP (1) | JPH01144667A (en]) |
| KR (1) | KR910009804B1 (en]) |
| CA (1) | CA1300281C (en]) |
| DE (1) | DE3880635T2 (en]) |
| MY (1) | MY103799A (en]) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2953755B2 (ja) * | 1990-07-16 | 1999-09-27 | 株式会社東芝 | マスタスライス方式の半導体装置 |
| US5250834A (en) * | 1991-09-19 | 1993-10-05 | International Business Machines Corporation | Silicide interconnection with schottky barrier diode isolation |
| KR20160133113A (ko) | 2015-05-12 | 2016-11-22 | 김금녀 | 음성 안내 매트 |
Family Cites Families (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE7145628U (de) * | 1970-12-10 | 1972-03-16 | Motorola Inc | Integrierter transistor mit saettigungsanzeiger |
| US3720848A (en) * | 1971-07-01 | 1973-03-13 | Motorola Inc | Solid-state relay |
| US4336489A (en) * | 1980-06-30 | 1982-06-22 | National Semiconductor Corporation | Zener regulator in butted guard band CMOS |
| US4628340A (en) * | 1983-02-22 | 1986-12-09 | Tokyo Shibaura Denki Kabushiki Kaisha | CMOS RAM with no latch-up phenomenon |
| US4823314A (en) * | 1985-12-13 | 1989-04-18 | Intel Corporation | Integrated circuit dual port static memory cell |
| US4829359A (en) * | 1987-05-29 | 1989-05-09 | Harris Corp. | CMOS device having reduced spacing between N and P channel |
-
1987
- 1987-11-30 JP JP62302603A patent/JPH01144667A/ja active Granted
-
1988
- 1988-11-25 DE DE8888119715T patent/DE3880635T2/de not_active Expired - Fee Related
- 1988-11-25 EP EP88119715A patent/EP0318869B1/en not_active Expired - Lifetime
- 1988-11-28 MY MYPI88001378A patent/MY103799A/en unknown
- 1988-11-28 CA CA000584287A patent/CA1300281C/en not_active Expired - Lifetime
- 1988-11-30 KR KR1019880015886A patent/KR910009804B1/ko not_active Expired
-
1990
- 1990-05-15 US US07/523,178 patent/US4980745A/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| JPH01144667A (ja) | 1989-06-06 |
| EP0318869A1 (en) | 1989-06-07 |
| EP0318869B1 (en) | 1993-04-28 |
| US4980745A (en) | 1990-12-25 |
| KR910009804B1 (ko) | 1991-11-30 |
| DE3880635T2 (de) | 1993-08-05 |
| DE3880635D1 (de) | 1993-06-03 |
| KR890008977A (ko) | 1989-07-13 |
| JPH0513542B2 (en]) | 1993-02-22 |
| MY103799A (en) | 1993-09-30 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| MKLA | Lapsed | ||
| MKEC | Expiry (correction) |
Effective date: 20121205 |